Advanced Expert Analysis
We analyze foreign matters found in products or manufacturing processes, primarily using nondestructive analytical methods. We analyze the samples of clients in an extremely efficient manner to investigate the possible cause of foreign matter contamination in the shortest possible time. For your desired delivery date, please feel free to contact us. In addition, we shall propose appropriate analytical methods suitable for different types of foreign matters.
We also support formulation development using nondestructive analytical techniques such as surface imaging.
- Digital microscope
- X-ray fluorescence spectrometer (micro-XRF)
- Scanning electron microscope/energy dispersive X-ray micro-analyzer (SEM-EDX）
- FT-IR microscope
- Laser Raman microscope
- Time-of-flight secondary ion mass spectrometry (TOF-SIMS)
- X-ray photoelectron spectroscopy (XPS)
- Confocal microscope
- 3D X-Ray microscopic CT scanner
- X-ray diffractometer (XRD)